Simulating Single Event Transients in VDSM ICs for Ground Level Radiation
نویسندگان
چکیده
This work considers a tool for simulating single event transients produced by ground level radiation in VDSM ICs. Fault injection procedures and a fast fault simulation algorithm for transient faults were implemented around an event driven simulator. A statistical analysis was implemented to organize data sampled from simulations. The performance evaluation of the algorithm shows that for a large number of fault injections, the algorithm is much faster than a serial fault simulation approach.
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ورودعنوان ژورنال:
- J. Electronic Testing
دوره 20 شماره
صفحات -
تاریخ انتشار 2004